Research in Thin Film Memories

Abstract

The Research Institute for the Communication-Technological Industry investigated the technology and structure of thin magnetic-layer memories for the past five years. Data on the vapor-deposited plane memories and wire memories were presented. Electron micrographs were presented of a 80/20 Ni/Fe layer (15,000 X magnification), a 60/40 Ni/Fe layer (15,000), and a pure Fe layer (15,000). The instrument devised for establishing the hysteresis characteristics and some hysteresis diagrams for a 81/19 Ni/Fe layer were shown. The wire memories were found to have a number of advantages over the plane memories, but they are more heat-sensitive.

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Document Details

Document Type
Technical Report
Publication Date
Jul 29, 1971
Accession Number
AD0744703

Entities

People

  • Janos Katona

Organizations

  • National Air and Space Intelligence Center

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Circuit Boards
  • Electron Microscopes
  • Ferrites
  • Films
  • Foreign Technology
  • Laminated Plastics
  • Magnetic Fields
  • Magnetic Films
  • Material Degradation Processes
  • Materials
  • Materials Processing
  • Power Supplies
  • Printed Circuits
  • Production Engineering
  • Thin Films
  • Vapor Deposition
  • X Rays

Readers

  • Computer Science/Computer Engineering/Data Science/Digital Signal Processing.
  • Surface Engineering/Surface Coating Technology.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene