Semiconductor and Nonsemiconductor Damage Study

Abstract

Contents: Determination of threshold failure levels of semiconductor diodes and transistors due to pulse voltages; Estimates of semiconductor failure due to multiple voltage pulses; Semiconductor damage test results; Nonsemiconductor damage test results.

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Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1969
Accession Number
AD0745926

Entities

People

  • D. C. Wunsch
  • L. Marzitelli

Organizations

  • Braddock Dunn & McDonald

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Circuit Analysis
  • Electron Tubes
  • Electronic Circuits
  • Electronics Laboratories
  • Energy Levels
  • Failure Mode And Effect Analysis
  • High Voltage
  • Modules (Electronics)
  • P-N Junction Diodes
  • P-N Junctions
  • Semiconductor Devices
  • Semiconductor Diodes
  • Semiconductors
  • Thermal Conductivity
  • Tunnel Diodes
  • Two Dimensional
  • Zener Diodes

Fields of Study

  • Engineering

Readers

  • Mechanical Engineering/Mechanics of Materials.
  • Quantum Dot Semiconductor Device Photonics and Graphene Optoelectronic Materials and THz Physics.

Technology Areas

  • Microelectronics