TREE Preferred Procedures (Selected Electronic Parts)

Abstract

It is the purpose of this document to provide persons conducting TREE (Transient Radiation Effects on Electronics) experiments with recommended procedures which experience has shown are efficient for determining transient- radiation effects on electronic parts. Areas which are covered in detail are experimental design, experimental documentation, dosimetry and environmental correlation, and preferred measurement procedures for diodes, transistors, capacitors, and microcircuits.

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Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1972
Accession Number
AD0746851

Entities

People

  • Michael L. Green
  • Richard K. Thatcher

Organizations

  • Battelle Memorial Institute

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Circuit Analysis
  • Circuit Testers
  • Computational Science
  • Data Analysis
  • Electromagnetic Fields
  • Electronic Components
  • Electronics Laboratories
  • Field Effect Transistors
  • Information Science
  • Materials Science
  • Measurement
  • Modules (Electronics)
  • Nuclear Reactors
  • Power Electronics
  • Quantum Yields
  • Semiconductors
  • Test And Evaluation

Fields of Study

  • Physics

Readers

  • Nuclear and Radiation Engineering.
  • Software Engineering

Technology Areas

  • Microelectronics