Conduction Mechanisms in Thick Film Microcircuits

Abstract

Preliminary results on resistor microstructure are presented and their correlation with the proposed model discussed. The study of RuO2-glass composites led to the conclusion that the difference in thermal expansion between the RuO2 and the glass is a minor factor in controlling resistor TCR. Preliminary studies of the resistance changes during firing of a thick film resistor are described. Evaluation of the performance of the screen printing machine has established that the variations in resistor value which can be expected from this phase of the process will be less than plus or minus 5%.

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Document Details

Document Type
Technical Report
Publication Date
Aug 01, 1972
Accession Number
AD0747980

Entities

People

  • R. W. Vest

Organizations

  • Purdue Research Foundation

Tags

Communities of Interest

  • Energy and Power Technologies
  • Weapons Technologies

DTIC Thesaurus Topics

  • Air Force
  • Coefficients
  • Composite Materials
  • Electric Charge
  • Electrical Properties
  • Electrical Resistance
  • Film Resistors
  • Materials
  • Materials Processing
  • Materials Science
  • Measurement
  • Physical Properties
  • Resistors
  • Single Crystals
  • Temperature Coefficients
  • Thermal Expansion
  • Thick Films

Readers

  • Reinforced Composite Materials
  • Software Engineering
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene