Electrical Characterization of Complex Microcircuits

Abstract

Section 3000 of MIL-STD-883 was reviewed and rewritten. New or modified slash sheets to MIL-M-38510 were prepared for DTL and T2L-SSI logic circuits. 741 Operational Amplifier, 710/711/LM106 Differential Comparator, and the 723 Regulator. The results of the vendor comparison, test circuits, and proposed slash sheets are included. Test profiles were prepared for a broad range of bipolar and MOS semiconductor memories. ROM's PROM's, and static and dynamic RAM's were considered. The test profiles cover static and dynamic functional test requirements. MSI/LSI test considerations were based upon the development of a minimum set of logic tests, based upon a stuck-at-one, stuck-at-zero philosophy in order to provide a rapid and accurate functional test of complex devices. This testing criteria termed 'Logic Integrity Tests' is described and is proposed for inclusion in MIL-STD-883. Test Vectors based upon the Logic Integrity Test for the 2 and 4 bit full adders, 4 x 2 multiplier and the 9341/54181 Arithmetic Logic Unit are included in this report.

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Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1972
Accession Number
AD0748242

Entities

People

  • David A. Citrin

Organizations

  • General Electric

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Amplifiers
  • Circuit Analysis
  • Circuit Testers
  • Circuits
  • Computer Programs
  • Computers
  • Electronic Circuits
  • Logic
  • Logic Gates
  • Operational Amplifiers
  • Plastic Explosives
  • Standards
  • Test And Evaluation
  • Test Equipment
  • Test Methods
  • Voltage
  • Waveforms

Readers

  • Aerospace Test and Evaluation
  • Integrated Circuit Design and Technology.

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems