A Study of Permanent Electron Beam Radiation Effects on Thin Film Single Junction Quantum Interferometer Devices.

Abstract

Mercereau-Nisenoff, single junction, superconducting, quantum i interferometer devices were irradiated at room temperature with 60 Mev electrons. After irradiation these devices showed no optically observable gross physical defects. There were, however four levels of electrical response to radiation damage dependent on the total accumulated dose. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1972
Accession Number
AD0749065

Entities

People

  • Richard Gerald Thomas Welsh

Organizations

  • Naval Postgraduate School

Tags

DTIC Thesaurus Topics

  • Corpuscular Radiation
  • Determinants (Mathematics)
  • Electromagnetic Radiation
  • Electron Beams
  • Electrons
  • Elementary Fermions
  • Elementary Particles
  • Fermions
  • Films
  • Interferometers
  • Ionizing Radiation
  • Nuclear Radiation
  • Radiation
  • Radiation Effects
  • Thin Films

Fields of Study

  • Physics

Readers

  • Nuclear and Radiation Engineering.
  • Spectroscopy.
  • Superconducting Magnet Technology

Technology Areas

  • Directed Energy
  • Directed Energy - Pulsed-Laser Deposition
  • Microelectronics
  • Quantum Computing