Yield of Electronic Materials and Devices
Abstract
A study has been made of problems associated with production yield of electronic materials and associated devices. The fraction of starting material resulting in useful end-items is considered as the effective yield from the government's point of view. Reliability considerations are of necessity given important weight in the deliberations of the Committee. The report discusses practical problems of fabrication process and techniques, problem arising from current practice in specifications and standards, and problems arising from system applications and use. An unusual real-life case history of a major reliability study closes the report.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jul 01, 1972
- Accession Number
- AD0749984