Beam Correction Device Used in Electron-Optical Instruments,

Abstract

An instrument for bending a flat beam of electrons was made smaller and is described in the report. The biasing voltages for introducing a correction in the path followed by the electrons are not critical.

Document Details

Document Type
Technical Report
Publication Date
Aug 25, 1972
Accession Number
AD0750489

Entities

People

  • A. S. Lebedinskii
  • G. S. Krivosheya

Organizations

  • National Air and Space Intelligence Center

Tags

DTIC Thesaurus Topics

  • Charged Particles
  • Electrons
  • Elementary Fermions
  • Elementary Particles
  • Fermions
  • Leptons
  • Optical Instruments

Fields of Study

  • Physics

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems