Absolute Yields of X-Ray Induced Photoemission from Metals.

Abstract

Absolute electron yields from tantalum, molybdenum, copper and aluminum have been measured for several bombarding geometries. The photon spectra used were derived from filtered bremsstrahlung generated in a tungsten anode at 50 kV, constant potential. The electron spectra were measured by a cylindrical electrostatic analyzer with a secondary emission detector. The spectra exhibit both Auger and scattered photoelectrons. The electron current densities arising from these spectra constitute source functions for vulnerability studies on systems exposed to internal electromagnetic pulse (IEMP) effects arising from nuclear environments. (Author)

Document Details

Document Type
Technical Report
Publication Date
Aug 23, 1972
Accession Number
AD0750875

Entities

People

  • John N. Bradford

Organizations

  • Air Force Cambridge Research Laboratories

Tags

DTIC Thesaurus Topics

  • Analyzers
  • Current Density
  • Detectors
  • Electromagnetic Pulses
  • Electrons
  • Electrostatic Analyzers
  • Emission
  • Internal Electromagnetic Pulses
  • Metals
  • Photoelectric Emission
  • Photoelectrons
  • Secondary Emission
  • Spectra
  • X Rays

Fields of Study

  • Physics

Readers

  • Pulsed Power and Plasma Physics.
  • Spectroscopy.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics