Pulsed-Power Burnout of Integrated Circuits

Abstract

Results of pulsed-power burnout testing the Fairchild 9046 quad dual-input nand gate and the Amelco 6041 three-input nand gate showed the circuits to be vulnerable to junction burnout for pulses of less than 100 V and pulse widths on the order of 100 nsec. Calculations based on Wunsch-Bell junction burnout theory showed good agreement with the experimental results. Sample calculations applying Wunsch-Bell theory to integrated circuits are given.

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Document Details

Document Type
Technical Report
Publication Date
Aug 15, 1972
Accession Number
AD0752540

Entities

People

  • R. H. Vandre

Organizations

  • The Aerospace Corporation

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Abstracts
  • Agreements
  • Air Force
  • Chemical Kinetics
  • Circuits
  • Diagrams
  • Electronics
  • Experimental Data
  • Integrated Circuits
  • Materials
  • Nand Gates
  • Pulsed Power
  • Radiation
  • Semiconductor Devices
  • Semiconductor Junctions
  • Semiconductors
  • Transistors

Fields of Study

  • Physics

Readers

  • Electrical Engineering
  • Integrated Circuit Design and Technology.