Electron Microscope Study of Dauphine Microtwins Formed in Synthetic Quartz

Abstract

Specimens of synthetic quartz were examined by transmission electron microscopy. Dauphine twins in (0001) sections, produced by cooling through the inversion temperature, were decorated at the boundaries by black spots caused by radiation damage in the microscope. These boundaries were straight lines following crystallographic directions. A misorientation between twins and matrix accounts for intensity differences between the two regions. The results are compared with those obtained with (1120) sections where fringe contrast at the twin boundary occurs because of differences in extinction distance for certain reflections. Smaller, more numerous twins were formed in electron damaged regions during examination in the microscope.

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Document Details

Document Type
Technical Report
Publication Date
Jan 04, 1972
Accession Number
AD0752768

Entities

People

  • J. J. Comer

Organizations

  • Air Force Cambridge Research Laboratories

Tags

Communities of Interest

  • Air Platforms

DTIC Thesaurus Topics

  • Annealing
  • Boundaries
  • Contrast
  • Crystals
  • Detection
  • Electron Beams
  • Electron Microscopes
  • Electron Microscopy
  • Electrons
  • Extinction
  • Fast Neutrons
  • Fungi
  • Intensity
  • Microscopes
  • Microscopy
  • Radiation
  • Transmission Electron Microscopy

Readers

  • Materials Science and Engineering.

Technology Areas

  • Microelectronics