Structure, Properties and Radiation Sensitivity of Electrically Bistable Materials. Thermal Stability of As2Se3-As2Te3 Glasses

Abstract

The report contains some new measurements on the thermal stability of As2Se3-As2Te3 glasses in which multiple crystallization processes have been found by differential scanning calorimetry. Discussion is given of the structure of As2Se3 films by comparing intensity and rdf curves obtained experimentally with theoretical curves derived from a microcrystallite model. The data strongly indicates that a glassy network model is more in accord with the experimental rdf than a microcrystalline model. Continuation of the work on the interaction between As2Se3 and Cu support grids is indicative of the formation of Cu(2-x)Se upon heat treatment. Finally a review article on electron diffraction rdfs of amorphous films prepared for the Physics of Thin Films is included.

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Document Details

Document Type
Technical Report
Publication Date
Sep 06, 1972
Accession Number
AD0752993

Entities

People

  • Derek B. Dove
  • Ronald E. Loehman

Organizations

  • University of Florida

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Amorphous Materials
  • Crystal Structure
  • Crystals
  • Diffraction
  • Electron Microscopes
  • Electron Microscopy
  • Electrons
  • Glass
  • Glass Transition Temperature
  • Heat Energy
  • Heat Treatment
  • Materials
  • Materials Science
  • Measurement
  • Microscopy
  • Scattering
  • Transition Temperature

Fields of Study

  • Physics

Readers

  • Materials Science and Engineering.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene