Temperature Dependence of Diffracted Beam Intensities of Slow Electrons as Criteria of Surface Purity,
Abstract
The temperature dependence of the intensity, I, of a diffracted beam of electrons from plane (100) of PbS was studied as a function of slight impurities on the surface. For specimens in which the residual gases were frozen, log I decreased linearly as the temperature increased from -100 to 200 degrees. But, in the presence of residual gases of about 10-anion(5) mm Hg, log I at temperatures smaller than 0 degrees varies sufficiently to be an indication of the purity of the surface. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Nov 24, 1972
- Accession Number
- AD0753556
Entities
People
- An Tuan Khoang
- G. K. Zyryanov
Organizations
- National Air and Space Intelligence Center