Laser Mirror Technology.
Abstract
The effects of microroughness, crystalline imperfections, and thin film deposition conditions on the absorption of infrared radiation by laser mirrors are discussed. New instruments described include the Optical Evaluation Facility for measuring absorption and scattering from samples of arbitrary size and curvature, and a modulated ellipsometer for in situ measurements of optical properties of samples under ultrahigh vacuum conditions and conditions of known residual gas environment. Techniques for characterizing surfaces with microirregularities using optical scattering, optical and electron microscopy, and interferometry are described. Initial results obtained using the modulated ellipsometer are discussed, and data obtained from measurements of infrared absorption on silver surfaces of known roughness are presented. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Nov 01, 1972
- Accession Number
- AD0754101
Entities
People
- D. K. Burge
- H. E. Bennett
- J. L. Stanford
- J. M. Bennett
- K. H. Westmacott
Organizations
- Naval Air Weapons Station China Lake