Contact Reliability Screening

Abstract

F30602-71-C-0148RADCTR-72-326(*electronic relays, nondestructive testing), reliability(electronics), accelerated testing, test equipment, life expectancy, regression analysis, mathematical modelsThe objectives of this study were to determine if a relationship exists between relay intermodulation products and constriction resistence, on the one hand, and relay life, on the other and to quantify the relationship if it exists. It turns out that both I.M. products and constriction resistance are related, statistically, to relay life although the measurement of constriction resistance had a destructive effect on the contacts and hence, on relay life. However, I.M. products measurement made early in life, on both button and bifurcated type contacts, is a good predictor of relay life. These results were obtained at accelerated operating conditions.

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Document Details

Document Type
Technical Report
Publication Date
Dec 01, 1972
Accession Number
AD0755923

Entities

People

  • J. R. Collins
  • R. E. Schafer
  • R. W. Dueck
  • T. F. Odell
  • T. S. Sheffield

Organizations

  • Hughes Aircraft Company

Tags

Communities of Interest

  • Advanced Electronics
  • Biomedical
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Accuracy
  • Chi Square Test
  • Computer Programs
  • Data Science
  • Experimental Design
  • Failure Mode And Effect Analysis
  • Goodness Of Fit Tests
  • Information Science
  • Life Tests
  • Measurement
  • Power Supplies
  • Regression Analysis
  • Relaxation Oscillators
  • Statistical Analysis
  • Test And Evaluation
  • Test Equipment
  • Test Methods

Readers

  • Materials Science and Engineering.
  • Structural Health Monitoring of Composite Structures.
  • Tactical Satellite Communications Systems Engineering.

Technology Areas

  • Microelectronics