Evaluation of Multilayer Thin Films. Phase II.
Abstract
Thin films of aluminum and titanium alloys on collodion membranes were bulge tested and the strength of the films was calculated. The values obtained for films less than 500 A thick ranged above 0.5 Mpsi for aluminum and 1 Mpsi for titanium. Unsupported films of aluminum oxide, boron carbide, and silicon nitride were prepared by deposition on a copper foil replica of a glass surface and later dissolving the copper. The strengths of these films were between 4 and 27 kpsi. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Feb 01, 1973
- Accession Number
- AD0756582
Entities
People
- Fred Ordway