Transport of Electrons and Holes in Semi-conductors.

Abstract

Work related to the investigation of excess carrier lifetime as a function of hydrostatic pressure in germanium, to the investigation of high-stress piezodrift effects in p-type germanium, and to the investigation of high-stress piezoresistance of p-type germanium has been completed and published. Studies involving transport behavior of charge carriers in silicon and gallium phosphide are being continued. Apparatus has been constructed to perform the required transport measurements down to 4 degrees K under high uniaxial stress. Work directed toward the construction of the phonon spectrum of lead iodide crystals is being continued. Coupling on consultation activities are briefly described. A list of degrees awarded and articles published under the sponsorship of the grant is included. (Author Modified Abstract)

Document Details

Document Type
Technical Report
Publication Date
Mar 01, 1973
Accession Number
AD0757232

Entities

People

  • John P. Mckelvey

Organizations

  • Pennsylvania State University

Tags

DTIC Thesaurus Topics

  • Abstracts
  • Charge Carriers
  • Charged Particles
  • Construction
  • Couplings
  • Electrons
  • Germanium
  • Hydrostatic Pressure
  • Measurement
  • Pressure Measurement
  • Spectra
  • Transport Ships

Readers

  • Mechanical Engineering/Mechanics of Materials.
  • Semiconductor Device Technology
  • Team-Based Human-Centered Cognitive Task Decision Making and Information Performance.

Technology Areas

  • Microelectronics