Physical Characterization of Electronic Materials, Devices and Thin Films
Abstract
The research is directed toward the characterization of specified physical, chemical and structural properties of various materials. Experimental methods include chemical analysis, electron microscopy and reflection diffraction, X-ray diffraction and fluorescence analysis, light microscopy and electron microprobe analysis, in addition to the determination of specific properties, such as density, hardness and thermal conductivity. Special services, such as crystal orientation, cutting, grinding and polishing are also being performed. Specific materials submitted for characterization include lithium germanate, silicon, silicon carbide, quartz, ruby, gallium arsenide, boron, lithium niobate, lithium tantalate, lithium fluoride, potassium chloride, sodium chloride, potassium bromide, gallium phosphide, indium phosphide, calcium fluoride, zinc telluride, bismuth germanium oxide and aluminum nitride. In addition, a variety of specimens have been submitted for specific studies such as phase identification, crystallinity and chemical analysis.
Document Details
- Document Type
- Technical Report
- Publication Date
- Dec 01, 1972
- Accession Number
- AD0758197
Entities
People
- Konstantin Kreder
- S. Andrew Kulin