Conductivity Profile of CdS After Sulfur Diffusion,
Abstract
A novel technique has been employed to determine the conductivity profile in the diffusion layer of cadmium sulfide acousto-electric transducers. The method requires measurement of the series resistance of the layer over a wide frequency range. When the method was applied to the CdS transducer, the conductivity was found to be proportional to the inverse third power of the distance from the end of the diffused layer. From the conductivity profile, the series capacitance as a function of frequency was computed, and results were found to agree well with measurements, confirming the validity of the method. Although this method was only applied to the CdS transducer, it should also be useful in determining the conductivity profile in similar junctions and in other materials. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Feb 01, 1973
- Accession Number
- AD0758450
Entities
People
- Walter A. Riessler
Organizations
- Harry Diamond Laboratories