Plasma Anodization.

Abstract

The process of plasma anodization has been investigated using two systems. The first was a cold cathode dc discharge system (replacing apparatus described in our earlier reports) with automated ellipsometry to continuously follow the growth of the oxide. The second system employed an r.f. discharge with growth of the oxide being followed by monitoring the intensity reflectivity of s-light from a He/Ne laser. Experiments are described which indicate that negative oxygen ions form the plasma are not directly involved in the growth of oxides on tantalum in a d.c. discharge. Also reported are data on the thickness-and temperature-dependence of the relation between oxide field and oxide growth rate for the case of Si anodization in an r.f. dicharge. (Author)

Document Details

Document Type
Technical Report
Publication Date
Nov 01, 1972
Accession Number
AD0760171

Entities

People

  • David L. Pulfrey
  • Graham Olive
  • Lawrence Young

Organizations

  • University of British Columbia

Tags

DTIC Thesaurus Topics

  • Anodizing
  • Intensity
  • Monitoring
  • Physical Properties
  • Reflectivity
  • Tantalum
  • Thickness

Fields of Study

  • Physics

Readers

  • Plasma Physics.
  • Thin Film Deposition Science.

Technology Areas

  • Directed Energy
  • Directed Energy - Lasers
  • Directed Energy - Pulsed-Laser Deposition