Structure, Properties and Radiation Sensitivity of Electrically Bistable Materials

Abstract

The report contains a review of work carried out on the electrical properties of contacts to chalcogenide glasses. The room temperature electrical properties of thin films of glasses have been measured with both sandwich and planar electrode configurations. Conductance and capacitance were measured versus frequency in the two cases as a function of bias voltage. A variation in response was found with bias voltage except in the case of the planar structure with molybdenum electrodes. The variation is quite consistent with a model in which Schottky barriers exist at the electrodes. Measurements of the spectral distribution of noise currents have also been made for the two film configurations under bias and no bias conditions. All devices showed an increase in noise by several orders of magnitude when a biasing voltage was applied.

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Document Details

Document Type
Technical Report
Publication Date
Feb 06, 1973
Accession Number
AD0760335

Entities

People

  • Derek B. Dove
  • Ronald E. Loehman

Organizations

  • University of Florida

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Capacitance
  • Chemical Compounds
  • Electrical Properties
  • Engineering
  • Equivalent Circuits
  • Films
  • Materials
  • Materials Science
  • Measurement
  • Metal-Semiconductor Junctions
  • Planar Structures
  • Radiation
  • Semiconducting Films
  • Semiconductors
  • Sensitivity
  • Thin Films
  • Universities

Fields of Study

  • Materials science

Readers

  • Electrical Engineering
  • Integrated Circuit Design and Technology.
  • Materials Science and Engineering.