The Use of Scanning Auger Spectroscopy for Surface Analysis.

Abstract

A scanning Auger microscope was constructed at the Air Force Avionics Laboratory to permit surface analysis of solid state devices. The instrument was operated in a scanning electron microscope mode for initial tests and calibration. Electron gun operation was verified by measuring a beam current of 0.8 microampere. Electron beam diameter was determined to be approximately 20 microns by observing the resolution of the display. A cylindrical mirror analyzer was installed on the electron gun assembly and synchronous detection techniques were used to record Auger spectra. An apparent inability to record Auger peaks was localized to the analyzer. Wiring diagrams and operating instructions were formulated for the use of future operators of the apparatus. (Author)

Document Details

Document Type
Technical Report
Publication Date
Mar 01, 1973
Accession Number
AD0760550

Entities

People

  • Roger L. Counts

Organizations

  • Air Force Institute of Technology

Tags

DTIC Thesaurus Topics

  • Air Force
  • Analyzers
  • Electron Beams
  • Electron Guns
  • Electron Microscopes
  • Electrons
  • Microscopes
  • Scanning
  • Scanning Electron Microscopes
  • Spectra
  • Spectroscopy
  • Surface Analysis
  • Surfaces
  • Wiring Diagrams

Fields of Study

  • Physics

Readers

  • Computer Science/Computer Engineering/Data Science/Digital Signal Processing.
  • Plasma Physics.
  • Solar Physics

Technology Areas

  • Directed Energy
  • Microelectronics
  • Microelectronics - Microelectromechanical Systems