X-Ray Topography of Shock Loaded Copper Crystals,

Abstract

Single crystals of high purity copper subjected to shock loading have been examined by X-ray diffraction topography. The topographs reveal a basic substructure consisting of narrow, close packed kinks normal to highly stressed slip directions and extending rather homogeneously throughout the sample. In the vicinity of fractures, where gross macroscopic deformation occurs, complex interactions are observed. The substructure has been examined as a function of orientation and pressure. (Author)

Document Details

Document Type
Technical Report
Publication Date
May 01, 1973
Accession Number
AD0762146

Entities

People

  • P. W. Kingman

Organizations

  • Ballistic Research Laboratory

Tags

DTIC Thesaurus Topics

  • Crystals
  • Diffraction
  • Orientation (Direction)
  • Single Crystals
  • Topography
  • Wave Phenomena
  • X Rays
  • X-Ray Diffraction

Readers

  • Materials Science (Mechanical Engineering).
  • Materials Science and Engineering.