Research in Ferromagnetics: Domain Tip Devices.

Abstract

The design and operation of the DOT blocking type shift register is described and the results of tip blocking experiments presented. An electronic technique for determining the position of a channel defect is discussed. Defect size is also considered. Aluminum underlayer studies were performed with an optical instrument called the 3Aluminum Measuring Instrument3 (AMI). The effect of process chemicals on aluminum films was also studied. An optical magnetic film thickness measurement technique is described. A general comparison of the DOT and other storage technologies is presented. The DOT and Bubble are examined in more detail. DOT shift register techniques are described. These include input and output multiplexing and NDRO shift registers. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jan 31, 1973
Accession Number
AD0763086

Entities

People

  • Frank Corwin
  • Harvey I. Jauvtis
  • Robert J. Spain

Tags

Communities of Interest

  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Aluminum
  • Films
  • Magnetic Films
  • Measurement
  • Multiplexing
  • Optical Instruments
  • Shift Registers
  • Thickness

Fields of Study

  • Physics

Readers

  • Materials Science and Engineering.
  • Quantum Dot Semiconductor Device Photonics and Graphene Optoelectronic Materials and THz Physics.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene