Correlation of X-Ray and Electron Microscopic Studies of Fatigue.

Abstract

The fatigue behavior of Ni, Ni - 20% Co, and Ni - 60 wt % Co alloys is closely related to their stacking fault energies (SFE) which decrease with increasing % Co. Transmission electron microscopy (TEM) showed that well defined regular subgrains formed in Ni, and progressively more irregular subgrains formed in the alloys as the SFE decreased. TEM subgrain sizes correlated within a factor of two with subgrain sizes previously determined by X-ray diffraction; i.e., approximately 1000 A by TEM and 500 A by X-ray. Scanning electron microscopy (SEM) showed that in pure Ni, cracks initiated among persistent slip bands in grain interiors while in the lower SFE alloys cracks tended to initiate in twin and grain boundaries. (Modified author abstract)

Document Details

Document Type
Technical Report
Publication Date
Jul 12, 1973
Accession Number
AD0764282

Entities

People

  • J. Gerald Byrne

Organizations

  • University of Utah

Tags

DTIC Thesaurus Topics

  • Abstracts
  • Boundaries
  • Diffraction
  • Electron Microscopy
  • Electrons
  • Grain Boundaries
  • Microscopy
  • Optical Analysis
  • Scanning Electron Microscopy
  • Transmission Electron Microscopy
  • X Rays
  • X-Ray Diffraction

Readers

  • Materials Science (Mechanical Engineering).
  • Materials Science and Engineering.

Technology Areas

  • Microelectronics