Two-Meter Path Difference Interferometer for Fourier Spectroscopy.
Abstract
This is an interim report on the progress in the development of a high-resolving power interferometer to be used for line shape measurements. An interferometer is described in detail, as well as the data handling and processing schemes used. A resolution of 0.06/cm was obtained with the instrument operating out in the open with little concern for vibration isolation. Test results are included. (Modified author abstract)
Document Details
- Document Type
- Technical Report
- Publication Date
- Apr 11, 1973
- Accession Number
- AD0764719
Entities
People
- George Vanasse
- Hajime Sakai
- James Conrad Pritchard
Organizations
- Air Force Cambridge Research Laboratories