Investigation of 2 Millimeter Wave Image Conversion System.
Abstract
A program of investigation extending previously developed image conversion techniques to 2.15 millimeter wavelength (140 GHz) is described. The key feature of the image conversion system centers around using a novel scheme of conductivity modulation of a semiconductor panel to sample the millimeter wave image. Methods used for the design, construction and calibration of the experimental system are given in detail. Visible displays of millimeter wave images obtained using standard flat metal plates and an armored personnel carrier as object targets over extended ranges of up to 25 meters are presented. A discussion of the results reviews the factors limiting system sensitivity and concludes the sensitivity of the present method is inversely proportional to the square of the number of minimum resolvable elements in the viewing field. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Feb 01, 1973
- Accession Number
- AD0765418
Entities
People
- Ronald C. Hofer
Organizations
- United States Army Communications-Electronics Command