Nichrome Resistor Properties and Reliability.

Abstract

A collection of the physical properties of nichrome films is given. Graphs are presented giving property variations as functions of composition, deposition rate, method of deposition, substrate morphology etc. Failure mechanisms such as electromigration interdiffusion, corrosion and electrocorrosion are addressed and specific information is given with regard to real, possible and unlikely mechanisms. The report is intended to give a composite review of nichrome resistor technology from a process and reliability point of view.

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Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1973
Accession Number
AD0765534

Entities

People

  • Clyde H. Lane

Organizations

  • Rome Laboratory

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Adhesion
  • Aluminum Oxides
  • Composite Materials
  • Crystal Structure
  • Failure Mode And Effect Analysis
  • Film Resistors
  • Heat Treatment
  • Low Temperature
  • Materials
  • Measurement
  • Physical Properties
  • Resistors
  • Surface Properties
  • Temperature Coefficients
  • Thin Film Resistors
  • Thin Films
  • Water Vapor

Fields of Study

  • Engineering

Readers

  • Integrated Circuit Design and Technology.
  • Surface Coatings Technology.
  • Systems Analysis and Design