The Structure of Non-Crystalline Materials. Determination of Local Structure in Amorphous GeSe, GeSe2, As2 Se3, As2S3, and As2Te3 Using EXAFS

Abstract

Previously, it was shown that Fourier transforms of the extended x- ray absorption fine structure (EXAFS) contains information on the coordination distances and numbers about each constituent in multicomponent amorphous semiconductors. In this paper a method of analysis of the experimentally observed first coordination peak is presented which calculates the absolute number of each kind of atom which contributes to that peak.

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Document Details

Document Type
Technical Report
Publication Date
Aug 01, 1973
Accession Number
AD0766139

Entities

People

  • Dale E. Sayers
  • Edward A. Stern
  • Farrel W. Lytle

Organizations

  • Boeing

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Absorption
  • Absorption Coefficients
  • Amorphous Materials
  • Amplitude
  • Coefficients
  • Covalent Bonds
  • Crystal Structure
  • Distribution Functions
  • Electric Fields
  • Elements
  • Energy
  • Equations
  • Materials
  • Photoelectrons
  • Physics
  • Scattering
  • X Rays

Fields of Study

  • Physics

Readers

  • Atmospheric Science / Meteorology, specifically Wind Wave Turbulence.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics