Radiation Hardened Detector Electronics.
Abstract
An electronic method of reducing the effective noise induced in integrating optical detectors was developed and tested using simulated nuclear pulses. The technique uses compensation, in which a mirror image of the nuclear pulse is generated from a differentiated portion of the signal and added back to the main signal to achieve cancellation. This reduced the nuclear radiation noise by at least 30 db. A study was made to scope out the transient radiation response and the electrical operating characteristics of JFETs and MISFETs at temperatures ranging from room temperature down to 4K. Experimental measurements were performed on silicon JFET and MISFET devices, including D.C. electrical parameters and Flash x-ray radiation response. Analytical effort provides a compilation of silicon properties at low temperature, and scopes out the first-order temperature dependence of JFETs and MISFETs. The results show that reasonable agreement is achieved between predicted and observed behavior in most areas, though there are many problems which must be resolved to achieve adequate modeling and understanding of relevant phenomena. (Modified author abstract)
Document Details
- Document Type
- Technical Report
- Publication Date
- Apr 23, 1973
- Accession Number
- AD0766442
Entities
People
- Charles J. Repper
- David H. Swant
- David L. Enlow
- David M. Long
- William E. Austin
Organizations
- General Electric