An Improved Chemical Ionization Mass Spectroscopy System.
Abstract
The report concerns the development of a sophisticated and versatile medium resolution chemical ionization mass spectrometer. Because of special features of the ion source and optics the sensitivity of this apparatus exceeds by orders of magnitude the capabilities of previous instrumentation. A new ion source and related sample handling modifications based upon the design and testing of this spectrometer has been provided for the DuPont Model 490 mass spectrometer. A versatile interface for computer operation of mass spectrometer systems coupled to a PDP 11/20 computer has also been designed. Hardware and software developed for this purpose are described. Some preliminary results using an interfaced gas chromatograph/chemical ionization mass spectrometer/computer system are presented. (Modified author abstract) Portions of this document are not fully legible.
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 01, 1973
- Accession Number
- AD0766759
Entities
People
- Jean H. Futrell
Organizations
- Boeing