Combined Ellipsometric and Soft X-Ray Spectroscopic Studies of Corrosion Processes on Transparent Materials.
Abstract
The feasibility of carrying out systematic and precise surface characterization studies on transparent materials by ellipsometry has been established. Specifically, it is shown that one can detect and quantitatively measure the extent of the damaged surface layers on such transparent materials. Similarly, it is shown that the soft x-ray spectroscopic method can be used to characterize the contaminant film on any material even though the film may be compositionally inhomogeneous. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 05, 1973
- Accession Number
- AD0767790
Entities
People
- E. W. White
- K. Vedam
Organizations
- Pennsylvania State University