Forbidden Si (442) Structure Factor.
Abstract
A recent measurement by Trucano and Batterman of the forbidden Si (442) x-ray structure factor prompted the author to calculate this value by using a simple model for the electronic charge distribution with parameters determined from a given set of allowed formfactors. For the allowed formfactor experimental values of Raccah et al were used. For T = OK it was found that F(442) = 0.082 plus or minus 0.010, compared to Trucano and Batterman's bond value of 0.089 plus or minus 0.007 converted to T = OK. (Modified author abstract)
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 01, 1973
- Accession Number
- AD0768088
Entities
People
- A. Marcus Gray