Elemental Analysis of Materials by Energy-Dispersive Spectrometry of X- Rays Produced by a Focusing Electron Gun
Abstract
The construction and operation of a system for elemental analysis of materials by energy-dispersive x-ray analysis are described. Fluorescent x rays from samples are excited either directly by electrons from the gun or by secondary x rays produced by using the electrons to excite interchangeable thin targets. With electron energies up to 40 keV and beam currents as high as 300 microamps elemental concentrations as low as 0.1 micrograms and less than 10 ppm have been detected with short exposures. The sensitivity of this system is compared to systems which use radionuclides and protons to excite x rays.
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 01, 1973
- Accession Number
- AD0768352
Entities
People
- William Charles Nielsen Jr
Organizations
- Air Force Institute of Technology