Low Energy X-Ray and Electron Absorption Within Solids (100-1500 eV Region).

Abstract

This report presents tables for the x-ray absorption coefficients (sq cm/gm units) for all elements and for twenty six of the most commonly applied characteristic wavelengths in ultrasoft x-ray measurement and in the 8-110 Angstrom region. These are based upon the best available theory and experiment. The current measurements and theory are reviewed and a complete bibliography of experimental measurements for the low energy region is presented. Included in these tables are the mass absorption coefficients for the special compound materials which are used in low energy x-ray measurement for thin film window systems and for proportional counter gases. Also presented here are the self-absorption coefficients for the K alpha and L alpha radiations in this low energy x-ray region. A brief analysis of the deviation of the experimental data from the averaging table values is given for the light, medium and heavy element range.

Document Details

Document Type
Technical Report
Publication Date
Aug 01, 1973
Accession Number
AD0770055

Entities

People

  • Burton L. Henke
  • Eric S. Ebisu

Organizations

  • University of HawaiĘ»i System

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Absorption
  • Absorption Coefficients
  • Coefficients
  • Experimental Data
  • Films
  • Ionizing Radiation
  • Materials
  • Measurement
  • Proportional Counters
  • Radiation
  • Thin Films
  • X Rays

Fields of Study

  • Physics

Readers

  • Business Analytics
  • Spectroscopy.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics