Fatigue Crack Growth in Ti-6Al-4V from Threshold to Unstable Fracture,

Abstract

The fatigue crack growth of Ti-6Al-4V in the diffusion bond annealed condition was examined in the range of growth rates from 10 to the minus 12th power to 10 to the minus 4th power m/cycle with the use of compact tension and part-through-crack specimens. The effects of cyclic frequency and maximum stress were investigated. Fractured surfaces were examined by scanning electron microscopy over the entire range of crack growth. The fatigue data were fit empirically to a number of crack propagation laws, none of which was able to predict the entire range of crack growth from threshold to unstable fracture. When the fatigue crack growth rates were compared with those of Ti-6Al-4V of other microstructures, it was found that the diffusion bond annealed was among the most fatigue crack resistant of any microstructure examined. (Author)

Document Details

Document Type
Technical Report
Publication Date
Nov 30, 1973
Accession Number
AD0770980

Entities

People

  • E. George Kendall
  • Maurice F. Amateau
  • William D. Hanna

Organizations

  • The Aerospace Corporation

Tags

DTIC Thesaurus Topics

  • Crack Propagation
  • Cracks
  • Diffusion
  • Electron Microscopy
  • Electrons
  • Frequency
  • Microscopy
  • Microstructure
  • Optical Analysis
  • Scanning
  • Scanning Electron Microscopy

Fields of Study

  • Materials science

Readers

  • Materials Science (Mechanical Engineering).

Technology Areas

  • Microelectronics