Scanning Ellipsometric Spectroscopy: Study of the Formation of the Anodic Oxide Film on Noble Metals.

Abstract

The formation of the anodic oxide film on Pt has been investigated at wavelengths in the visible using voltage scanning ellipsometry. Changes in light intensity in an ellipsometric experiment were used to determine the changes in optical properties of the surface. From these three parameters, the effective complex refractive index and thickness of the surface film have been calculated, using a three-layer model. The anodic oxide film on Au has also been studied using this technique. (Modified author abstract)

Document Details

Document Type
Technical Report
Publication Date
Sep 01, 1973
Accession Number
AD0771466

Entities

People

  • B. D. Cahan
  • Ernest B. Yeager
  • Jean Horkans

Organizations

  • Case Western Reserve University

Tags

DTIC Thesaurus Topics

  • Abstracts
  • Films
  • Intensity
  • Optical Properties
  • Oxide Films
  • Oxides
  • Physical Properties
  • Refractive Index
  • Scanning
  • Spectroscopy
  • Thickness

Readers

  • Electrochemical Surface Science
  • Electromagnetic Wave Scattering and Antenna Radiation Engineering
  • Materials Science and Engineering.