A Study of Electronic Transport and Trapping in Technologically Important Insulators.

Abstract

The study of thin insulating films has two purposes: to develop effective methods for measuring the transport and trapping properties that are relevant to radiation hardness, and to investigate the effects on these properties caused by various methods of preparation and treatment of the films. (Modified author abstract)

Document Details

Document Type
Technical Report
Publication Date
Aug 01, 1973
Accession Number
AD0772609

Entities

People

  • Murray A. Lampert
  • Walter C. Johnson

Organizations

  • Princeton University

Tags

DTIC Thesaurus Topics

  • Abstracts
  • Dielectrics
  • Hardness
  • Materials
  • Mechanical Properties
  • Naval Vessels
  • Naval Vessels (Support)
  • Physical Properties
  • Radiation
  • Transport Ships

Readers

  • Materials Science and Engineering.
  • Quantum spin resonance or Electron Paramagnetic Resonance spectroscopy.
  • Systems Analysis and Design

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene