High Temperature Electrical Conductivity Measurement Techniques.

Abstract

The report deals with experiments aimed at a critical evaluation of electrical conductivity measurements on semiconducting and semi-insulating materials above 1500C. An initial study was made of the differential thermionic emission between two Pt-electrodes as a function of applied voltage, temperature and gas environment ('Double-diode'). Subsequent experiments on alumina and sapphire used a novel geometry, eliminating surface and gas conduction. Current densities in the range 1400-1650C appeared to be of the same order of magnitude as those observed between two Pt-electrodes in vacuum. The suggestion is made that the current through the oxide is determined by the difference between the thermionic emissions from the electrodes into the sample under small applied voltage. (Author)

Document Details

Document Type
Technical Report
Publication Date
Nov 01, 1973
Accession Number
AD0772776

Entities

People

  • H. P. R. Frederikse
  • W. R. Hosler

Organizations

  • National Institute of Standards and Technology

Tags

DTIC Thesaurus Topics

  • Conductivity
  • Current Density
  • Diodes (Electron Tubes)
  • Electrical Conductivity
  • Electrodes
  • Emission
  • High Temperature
  • Materials
  • Measurement
  • Thermionic Emission

Fields of Study

  • Materials science

Readers

  • Plasma Physics.
  • Semiconductor Device Technology

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene