Ellipsometric Examination of Passive Layers.
Abstract
Studies covering (1) the effect of electromodulation upon ellipsometric measurements of adsorption in the double layer and (2) the ellipsometric measurement of thickness and optical properties of a thin light absorbing film have resulted in a method for ellipsometric measurement which avoids the necessity for auxiliary measurement. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Dec 17, 1973
- Accession Number
- AD0773502
Entities
People
- J. O'm. Bockris
- W. K. Paik
Organizations
- University of Pennsylvania