Compton X-Ray Scattering.
Abstract
A new high precision method is developed for measuring Compton-line profiles quantitatively and to obtain the ratio of modified and unmodified radiation. The most important progress consisted in using monochromatic primary radiation produced by fluorescence. By an adapted geometrical arrangement the intensity-lost by monochromatization is only about 50%. The background until now in the order of 10% of the Compton peak is reduced to 0.2% for a paraffin scatterer and M0-Kx radiation. A small bump on the short wavelength flank of the paraffin-Compton-line profile is explained as PbLx,x2 lines. (Modified author abstract)
Document Details
- Document Type
- Technical Report
- Publication Date
- Dec 01, 1973
- Accession Number
- AD0774311
Entities
People
- Amy Mueller
- D. Weick
- R. Hosemann