Failure Analysis of AUTODIN Microelectronics.

Abstract

A total of 401 integrated circuits (IC), both monolithic and hybrid, were investigated. These devices were obtained from AUTODIN systems, which were being repaired at the Tobyhanna Army Depot, Tobyhanna, Pa. Results are discussed.

Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1974
Accession Number
AD0774796

Entities

People

  • E. B. Hakim
  • R. Holevinski

Organizations

  • United States Army Communications-Electronics Command

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Circuits
  • Electronics
  • Failure Analysis
  • Integrated Circuits
  • Microelectronics

Fields of Study

  • Engineering

Readers

  • Computer Science.
  • Integrated Circuit Design and Technology.
  • Logistics and Supply Chain Management.

Technology Areas

  • Microelectronics