A Rapid X-ray Diffractometer Method for Monitoring the Purity of NH4ClO4.

Abstract

The lattice parameters of six samples of NH4ClO4 and NH4ClO4/KclO4 solid solutions were determined by means of the wide angle X-ray diffractometer using fixed count techniques. This method of data retrieval using 1600 counts measured at 0.05 degrees 2 theta increments required about 10 minutes per reflection. The approximation method was employed for all calculations. The results indicated that this technique could be used to monitor the purity of NH4ClO4 with regard to KClO4 as solute in the NH4ClO4/KClO4 solid solution system. (Author)

Document Details

Document Type
Technical Report
Publication Date
Feb 01, 1974
Accession Number
AD0775379

Entities

People

  • Arthur J. Bracuti
  • Joseph Campisi

Organizations

  • Picatinny Arsenal

Tags

DTIC Thesaurus Topics

  • Diffractometers
  • Monitoring
  • Reflection
  • Solid Solutions
  • Wide Angles
  • X Rays

Readers

  • Computer Science/Computer Engineering/Data Science/Digital Signal Processing.
  • Quantum Chemistry
  • Surface Engineering/Surface Coating Technology.