Gruneisen Data from the Free Surface Velocity of Thermoelastic Materials

Abstract

A technique is presented for the measurement of the Gruneisen parameter of a solid from the free surface velocity induced by pulsed energy deposition. The technique is used to obtain both temperature-dependent and temperature-independent Gruneisen data. The measurements employ a velocity interferometer to determine the free surface velocity of solids exposed to a pulsed electron beam. Results are presented for Al, Cu, Ge and Si in a temperature range where the Gruneisen parameter is constant. In all cases the results are in excellent agreement with the thermodynamic values.

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Document Details

Document Type
Technical Report
Publication Date
May 01, 1973
Accession Number
AD0775423

Entities

People

  • D. R. Schallhorn
  • F. B. Mclean
  • R. B. Oswald
  • T. R. Oldham

Organizations

  • Harry Diamond Laboratories

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Accuracy
  • Agreements
  • Doppler Effect
  • Electron Beams
  • Electrons
  • High Energy
  • Interferometers
  • Lasers
  • Light Sources
  • Literature
  • Low Temperature
  • Materials
  • Measurement
  • New York
  • Radiation
  • Single Crystals
  • Solid State Physics

Fields of Study

  • Physics

Readers

  • Mechanical Engineering/Mechanics of Materials.
  • Semiconductor Device Technology
  • Thermal Physics or Thermal Science.

Technology Areas

  • Directed Energy
  • Directed Energy - Pulsed-Laser Deposition
  • Microelectronics
  • Microelectronics - Graphene