Electrical Characterization of Complex Microcircuits,
Abstract
The objective of this study has been to develop guidelines for the electrical characterization and testing of microcircuits of varying degrees of complexity and to aid in assuring conformance to their detailed specification. The 4000 series of CMOS circuits, 9500 and 10,000 series of ECL circuits, Schottky (T squared)L circuits, and a Phase Locked Loop were electrically characterized according to their DC, switching and functional characteristics. Vendor comparisons, specification guidelines, test circuits and design rules are included for each family where applicable. Studies in sufficient detail were performed to form the basis for the generation of MIL-M-38510 slash sheets for interchangeable parts for military use. A comprehensive electrical and functional evaluation of a semiconductor memory fabricated using the Isoplanar process was performed. (Modified author abstract)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 01, 1974
- Accession Number
- AD0775740
Entities
People
- David A. Citrin
Organizations
- General Electric