The Analysis of Optical Surface Scattering from Epitaxial Films.

Abstract

An expression has been derived for the transmission of infrared radiation through epitaxial films having a mat surface, which takes into account the scattering at the surface. This has been applied to the analysis of measurements of the fundamental absorption edge of epitaxial films of InAs. The results of this application include the evaluation of the intensity of the scattered light for several InAs films, and good agreement with published values of the absorption coefficient. (Author)

Document Details

Document Type
Technical Report
Publication Date
Nov 28, 1973
Accession Number
AD0775753

Entities

People

  • Richard N. Brown

Organizations

  • Air Force Cambridge Research Laboratories

Tags

DTIC Thesaurus Topics

  • Absorption
  • Absorption Coefficients
  • Agreements
  • Coefficients
  • Electromagnetic Radiation
  • Infrared Radiation
  • Intensity
  • Ionizing Radiation
  • Measurement
  • Optical Phenomena
  • Radiation
  • Scattering
  • Test And Evaluation

Fields of Study

  • Physics

Readers

  • Computer Vision.
  • Molecular Photonics/Laser Physics
  • Semiconductor Device Technology