Electronic Device Modeling.

Abstract

The software for implementation of the charge-control bipolar transistors model and the means for obtaining the parameters of the charge-control transistor model from experimental measurements are developed. A comparison of predicted and measured nonlinear distortion products based upon several junction field effect transistors is reported. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1974
Accession Number
AD0776091

Entities

People

  • L. Ehrman

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Active Electronic Components
  • Bipolar Junction Transistors
  • Distortion
  • Electronic Components
  • Electronic Equipment
  • Electronics
  • Field Effect Transistors
  • Measurement
  • Transistors

Fields of Study

  • Physics

Readers

  • Control Systems Engineering.
  • Electrical Engineering
  • Software Verification and Validation.

Technology Areas

  • Microelectronics