The Structure of Non-Crystalline Materials

Abstract

The primary purpose of this research was to develop the phenomenon of extended x-ray absorption fine structure (EXAFS) as a technique for investigating the structure of non-crystalline materials, particularly amorphous semiconductors.

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Document Details

Document Type
Technical Report
Publication Date
Dec 31, 1973
Accession Number
AD0776413

Entities

People

  • Farrel W. Lytle

Organizations

  • Boeing

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Absorption
  • Algorithms
  • Amorphous Materials
  • Computer Programs
  • Computers
  • Core Storage
  • Crystal Structure
  • Data Analysis
  • Data Processing
  • Data Storage Systems
  • Diffraction
  • Energy Bands
  • Fourier Analysis
  • Measurement
  • Radiation
  • Scattering
  • X Rays

Fields of Study

  • Physics

Readers

  • Nanofabrication and Microfabrication.
  • Powder metallurgy of Titanium alloys.
  • Quantum Dot Semiconductor Device Photonics and Graphene Optoelectronic Materials and THz Physics.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene