Radiation Effects on Semiconductor Materials and Devices.
Abstract
;Contents: Analytical studies; Recombination in irradiated silicon; Charge transport in silicon dioxide; Ionizing radiation effects on MOS devices; Measurement of drift mobility in low-lifetime silicon.
Document Details
- Document Type
- Technical Report
- Publication Date
- Dec 01, 1973
- Accession Number
- AD0776420
Entities
People
- J. R. Srour
- K. Y. Chiu
- O. L. Curtis Jr.
- S. Othmer
- V. D. Deokar