A Study of Electronics Radiation Hardness Assurance Techniques. Volume II, Part 3. Electrical Screening for Second Breakdown.
Abstract
The objectives of the second breakdown (SB) program were to determine analytical dependences for IC and power transistor SB susceptibility in neutron and gamma ray environments and to investigate means of prediction of SB in a radiation environment through nondestructive screening methods.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 01, 1974
- Accession Number
- AD0777187
Entities
People
- Allan H. Johnston
- D. W. Egelkrout
- I. Arimura
- L. L. Sivo
Organizations
- Boeing